|
What's on show
Armstrong Optical will be exhibiting the LSV laser vibrometer system from SIOS Meβtechnik GmbH. This instrument is a non contact laser vibrometer which measures the true displacement of a surface with time. The system measures movements with sub-nanometre resolution and translation rates of upto 1.5 m/s over a range of +/- 20 mm. For increased range the system is equipped with a zoom lens and is supplied with USB and fibre optic connectivity making it simple to integrate into experimental systems.
The operating and control software for the vibrometer enables spectrum analysis, digital filtering, external triggering and spectral averaging. For microscopic applications the vibrometer system has been incorporated into a microscope providing a 2µm focussed spot (x50 lens) enabling its use in such applications as piezo stack analysis.
Other SIOS interferometric systems are shown on the stand as well as an extensive range of non-contact optical metrology instrumentation.
|
