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Come and talk to Lambda about APE Research's high-resolution Scanning Probe Microscopes (SPM), whose range includes Atomic Force Microscopes (AFM), Scanning Tunnelling Microscopes (STM) and Scanning Near-field Optical Microscopes (SNOM)
The AFM range includes the A50-AFM which provides closed-loop X-Y positioning to achieve an absolute positioning accuracy of 2nm, and the low-cost R80-AFM with open-loop positioning.
APE Research provides Scanning Tunnelling Microscopes, for use in UHV or air, capable of scanning samples of almost any size and a simple-to-use acquisition and analysis software package.
APE Research's SNOM microscope can operate in reflection, transmission and back-reflection modes and is suitable for surface science, optics and biological applications.
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